論文 - 廣芝　伸哉

Low-glancing-angle x-ray diffraction study on the relationship between crystallinity and properties of C-60 field effect transistor

[H Ohashi,K Tanigaki,R Kumashiro,S Sugihara,S Hiroshiba,S Kimura,K Kato,M Takata]  ( 共著 )

APPLIED PHYSICS LETTERS   400   235   2004年01月

研究論文（学術雑誌）  英語

DOI